New RTForc™ software for calculating, displaying FORC distributions in real-time as FORC data using the 8600 Series VSM

You may already be aware of the 8600 Series VSM’s ability to execute first-order-reversal-curve (FORC) measurements quickly and easily, enabling one to generate FORCs in a fraction of the time it [...]

APL Materials article references the use of AC field Hall measurement for perovskite R&D

As part of the scientific community’s efforts to come up with better, less expensive, and easier-to-manufacture photovoltaic technology, much of the focus has been on developing perovskites as an [...]

Nov. 16 webinar on multi-carrier Hall analysis of low-mobility materials

In April, we partnered with the Material Research Society (MRS) to host a webinar discussing a new, much faster approach to Hall measurement and analysis of low-mobility materials. Now taking this [...]

Lake Shore acquires Janis Research Laboratory Cryogenics business

We are pleased to announce the acquisition of Janis Research’s Laboratory Cryogenics business — a move that unites two of the world’s leading providers of cryogenic and material characterization [...]

New Hall effect measurement technical note

Hall effect measurements are a fundamental tool for semiconductor material characterization. However, the challenge with some Hall voltage measurements is that they can be at low voltage levels, [...]

How to use an M91 FastHall measurement controller with a PPMS

A key benefit of our MeasureReady™ M91 FastHall™ measurement controller is that it can be used with any type of magnet, including a superconducting magnet. One such magnet system is the Physical [...]

July 10 is Helium Conservation Day

Liquid helium is the lifeline of tens of thousands of scientists and engineers across the global discovery and innovation landscape, including universities, industries, and national laboratories. [...]

Probe station app note discusses and compares wafer mounting methods

When using a cryogenic probe station, wafer mounting methodologies are a key element of wafer-level characterization. The mounting materials and approach will influence device temperature, sample [...]

New app note on vector VSM measurements available for download

If you’re interested in using a vibrating sample magnetometer to measure the vector components of magnetization and torque curves for magnetically anisotropic materials, then be sure to read our [...]

Upcoming webinar on cryogenic sensor installation techniques

Interested in knowing more about how to correctly install a sensor in a cryogenic application and to avoid common installation errors? Then be sure to join us for our June 18 webinar, "Cryogenic [...]

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