Hall effect measurements are a fundamental tool for semiconductor material characterization. However, the challenge with some Hall voltage measurements is that they can be at low voltage levels, and [...]
If you’re interested in learning more about Hall effect measurements, be sure to download our new Hall Effect Measurement Handbook: A Fundamental Tool for Semiconductor Material Characterization.
We’re pleased to announce that our new MeasureReady™ M91 FastHall™ measurement controller is now available to order. And to illustrate all that this revolutionary instrument offers, we’ve posted a [...]
Van der Waals (vdW) heterostructures offer researchers an unprecedented opportunity to tailor device architectures and derive new physical properties through atomic-scale layering of two-dimensional [...]
We have blogged about the benefits of the AC field Hall measurement method to characterize low-mobility materials. But even when mobilities aren’t very low, the AC method offers an advantage over the [...]
A new paper slated for publication in the IEEE Journal of the Electron Devices Society references the utility of a Lake Shore cryogenic probe station when performing superconducting microwave device [...]
We have blogged about Lake Shore being a Solutions Partner of Keysight Technologies. As a follow-up, we are excited to announce that we now have drivers that will enable you to centrally automate [...]