High-temperature, wafer-level capacitance measurement app note available

In this new app note, we explore using a Lake Shore CRX-4K cryogenic probe station equipped with our parametric probes and a high-temperature stage for making wafer-level capacitance-voltage (C-V) [...]

8600 Series plot book available for download

If you are interested in seeing typical measurement results for our award-winning 8600 Series VSM, download our new plot book. It includes results for:

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