Optimizing circuit setup in electronic device testing

DC Circuit Types

Many people forget that when you add instrumentation to your device under test (DUT), it becomes part of the circuit. Choosing the wrong circuit setup can cause unintended [...]

CPX-VF probe station used for CNT-based RF bolometer development research

From time to time, we like to highlight how our cryogenic probe stations are being used in interesting research. Our latest application focus is on work led by the University of Akron and published [...]

Preventing magnetic interference in electronic device measurement

The trouble with shielding

Electric fields and magnetic fields have similarities, but they also have distinct differences. Studies show that many students completing an electrical engineering program [...]

Avoiding ground loops in electronic device measurements

In a closed circuit, a return path must be provided for current to flow back to the power source; this return is often referred to as an electrical ground. Ideally, these ground connections would [...]

New parametric probe options for cryogenic probe stations

We’re now offering two new dual-connector parametric probe kits that make it much easier to perform capacitance-voltage (C-V) and four-point measurements in a Lake Shore probe station.

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