Sheet resistance measurements are a versatile tool that can be used in a wide variety of applications and industries, including:

When using a cryogenic probe station, wafer mounting methodologies are a key element of wafer-level characterization. The mounting materials and approach will influence device temperature, sample [...]

Van der Waals (vdW) heterostructures offer researchers an unprecedented opportunity to tailor device architectures and derive new physical properties through atomic-scale layering of two-dimensional [...]

In this new app note, we explore using a Lake Shore CRX-4K cryogenic probe station equipped with our parametric probes and a high-temperature stage for making wafer-level capacitance-voltage (C-V) [...]

Capacitance-voltage (C-V) measurements are widely used by device and material researchers to characterize fundamental properties of new devices—typically under ambient conditions. A new app note [...]

From time to time, we like to highlight how our cryogenic probe stations are being used in interesting research. Our latest application focus is on work led by the University of Akron and published [...]

We’re now offering two new dual-connector parametric probe kits that make it much easier to perform capacitance-voltage (C-V) and four-point measurements in a Lake Shore probe station.

If you have the need for some magnetic field in your experiments but not enough to warrant having a full magnet in your probe station, this new ring magnet kit option may be the solution for you.

A new paper slated for publication in the IEEE Journal of the Electron Devices Society references the utility of a Lake Shore cryogenic probe station when performing superconducting microwave device [...]

A recent Physics Today issue had an interesting article on the difficulties researchers continue to have with the volatile prices of liquid helium (LHe). The article noted the steps some have taken [...]