New app brief on variable temperature sheet resistance measurements

Landing-page-cover-AB2-four-wire-sheet-resistance-methodSheet resistance measurements are a versatile tool that can be used in a wide variety of applications and industries, including:

  • Characterizing the electrical properties of new materials
  • Monitoring the deposition process of thin films
  • Determining the uniformity of semiconducting and conductive thin films
  • Verifying the quality of electrode materials

Conventionally, sheet resistance measurements are carried out at room temperature. However, many thin-film materials are utilized in extreme temperature environments, like in cryostats for quantum technology development or at elevated temperatures for solar energy applications.

LakeShore-4-wire-sheet-resistance-measure-app-briefIn this new app brief, we demonstrate a variable temperature, four-wire sheet resistance measurement performed in a Lake Shore CRX-4K probe station capable of operating at temperatures below 4 K and at temperatures as high as 675 K. This setup also included our M81-SSM synchronous source measure system used for electrical measurements and the system’s MeasureLINK™ software used to continuously monitor temperature and carry out a current reversal protocol in the resistance measurement to remove thermoelectric voltage offsets.

Download the App Brief

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Tags: probe stations, resistance measurements, M81 synchronous source measure system, applications brief

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