A newly published Physical Review B paper references the use of our M81-SSM synchronous source measure system as part of antiferromagnetic (AFM) topological material research.

A new paper detailing the work of Georgia Tech researchers developing wide-bandgap semiconductor devices references the use of our new FastHall™ measurement technology for validating conductivity [...]

As part of the scientific community’s efforts to come up with better, less expensive, and easier-to-manufacture photovoltaic technology, much of the focus has been on developing perovskites as an [...]

In April, we partnered with the Material Research Society (MRS) to host a webinar discussing a new, much faster approach to Hall measurement and analysis of low-mobility materials. Now taking this [...]

Hall effect measurements are a fundamental tool for semiconductor material characterization. However, the challenge with some Hall voltage measurements is that they can be at low voltage levels, and [...]

A key benefit of our MeasureReady™ M91 FastHall™ measurement controller is that it can be used with any type of magnet, including a superconducting magnet. One such magnet system is the Physical [...]

If you’re interested in learning more about Hall effect measurements, be sure to download our new Hall Effect Measurement Handbook: A Fundamental Tool for Semiconductor Material Characterization.

This recent paper published in ACS Nano Letters (subscription required) leveraged the automation and flexibility of our Model 8425 Hall system with vertical-field, cryogenic probe station in order to [...]

There's a new addition to the Lake Shore Academy: "How Does it Work?" video education series. This introduction to [...]

We’re pleased to announce that our new MeasureReady™ M91 FastHall™ measurement controller is now available to order. And to illustrate all that this revolutionary instrument offers, we’ve posted a  [...]