You may already be aware of the 8600 Series VSM’s ability to execute first-order-reversal-curve (FORC) measurements quickly and easily, enabling one to generate FORCs in a fraction of the time it [...]
Andy Phillips
Recent Posts
As part of the scientific community’s efforts to come up with better, less expensive, and easier-to-manufacture photovoltaic technology, much of the focus has been on developing perovskites as an [...]
In April, we partnered with the Material Research Society (MRS) to host a webinar discussing a new, much faster approach to Hall measurement and analysis of low-mobility materials. Now taking this [...]
We are pleased to announce the acquisition of Janis Research’s Laboratory Cryogenics business — a move that unites two of the world’s leading providers of cryogenic and material characterization [...]
Hall effect measurements are a fundamental tool for semiconductor material characterization. However, the challenge with some Hall voltage measurements is that they can be at low voltage levels, [...]
A key benefit of our MeasureReady™ M91 FastHall™ measurement controller is that it can be used with any type of magnet, including a superconducting magnet. One such magnet system is the Physical [...]
When using a cryogenic probe station, wafer mounting methodologies are a key element of wafer-level characterization. The mounting materials and approach will influence device temperature, sample [...]
If you’re interested in using a vibrating sample magnetometer to measure the vector components of magnetization and torque curves for magnetically anisotropic materials, then be sure to read our [...]
Interested in knowing more about how to correctly install a sensor in a cryogenic application and to avoid common installation errors? Then be sure to join us for our June 18 webinar, "Cryogenic [...]
If you’re interested in learning more about Hall effect measurements, be sure to download our new Hall Effect Measurement Handbook: A Fundamental Tool for Semiconductor Material Characterization.