Andy Phillips

Recent Posts

Now taking orders for our new synchronous source measure system — watch the video

We are excited to now be taking customer orders for our new MeasureReady™ M81 Synchronous Source Measure (SSM) System — a unique, modular low-level measurement system that simplifies the setup and [...]

‘Practical Magnetism’ article notes the control capabilities of our VSM for FORC analysis

We blogged earlier about a paper referencing the use of the 8600 Series VSM for first-order reversal curve (FORC) measurements for magnetofossil research. On a related topic, we’d like to call [...]

Lake Shore scientist co-editor of book on magnetic measurement techniques

A new book slated to be published in late May and co-edited by our own Brad Dodrill is now available for order from Springer Nature.

"Magnetic Measurement Techniques for Materials [...]

New RTForc™ software for calculating, displaying FORC distributions in real-time as FORC data using the 8600 Series VSM

You may already be aware of the 8600 Series VSM’s ability to execute first-order-reversal-curve (FORC) measurements quickly and easily, enabling one to generate FORCs in a fraction of the time it [...]

APL Materials article references the use of AC field Hall measurement for perovskite R&D

As part of the scientific community’s efforts to come up with better, less expensive, and easier-to-manufacture photovoltaic technology, much of the focus has been on developing perovskites as an [...]

Nov. 16 webinar on multi-carrier Hall analysis of low-mobility materials

In April, we partnered with the Material Research Society (MRS) to host a webinar discussing a new, much faster approach to Hall measurement and analysis of low-mobility materials. Now taking this [...]

Lake Shore acquires Janis Research Laboratory Cryogenics business

We are pleased to announce the acquisition of Janis Research’s Laboratory Cryogenics business — a move that unites two of the world’s leading providers of cryogenic and material characterization [...]

New Hall effect measurement technical note

Hall effect measurements are a fundamental tool for semiconductor material characterization. However, the challenge with some Hall voltage measurements is that they can be at low voltage levels, [...]

How to use an M91 FastHall measurement controller with a PPMS

A key benefit of our MeasureReady™ M91 FastHall™ measurement controller is that it can be used with any type of magnet, including a superconducting magnet. One such magnet system is the Physical [...]

Probe station app note discusses and compares wafer mounting methods

When using a cryogenic probe station, wafer mounting methodologies are a key element of wafer-level characterization. The mounting materials and approach will influence device temperature, sample [...]

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