Capacitance-voltage (C-V) measurements are widely used by device and material researchers to characterize fundamental properties of new devices—typically under ambient conditions. A new app note [...]

This three-part Q&A features insights from three employees who played key roles in the design of the new MeasureReady™ 155 I/V source as well as the new XIP (pronounced “zip”) platform, Lake Shore’s [...]

A newly published Journal of Applied Physics paper details recent research of Washington State University’s Yue Cao, Mostafa Ahmadzadeh, Ke Xu, and Prof. John McCloy, and Lake Shore’s Brad Dodrill [...]

This three-part Q&A features insights from three employees who played key roles in the design of the new MeasureReady™ 155 I/V sourceas well as the new XIP (pronounced “zip”) platform, Lake Shore’s [...]