Read our 'Low-Level Measurements of Nanostructures' tech note

The study of new semiconducting materials, high temperature superconductors, photovoltaic devices, and organic electronic materials typically requires low-level sourcing and measurement because [...]

The technology behind the M81-SSM’s precise signal synchronization

One of the most unique features of our new modular MeasureReady™ M81-SSM synchronous source measure system is its patent-pending MeasureSync™ signal synchronization technology. This real-time [...]

Now taking orders for our new synchronous source measure system — watch the video

We are excited to now be taking customer orders for our new MeasureReady™ M81 Synchronous Source Measure (SSM) System — a unique, modular low-level measurement system that simplifies the setup and [...]

Optimizing circuit setup in electronic device testing

DC Circuit Types

Many people forget that when you add instrumentation to your device under test (DUT), it becomes part of the circuit. Choosing the wrong circuit setup can cause unintended [...]

Preventing magnetic interference in electronic device measurement

The trouble with shielding

Electric fields and magnetic fields have similarities, but they also have distinct differences. Studies show that many students completing an electrical engineering [...]

Avoiding ground loops in electronic device measurements

In a closed circuit, a return path must be provided for current to flow back to the power source; this return is often referred to as an electrical ground. Ideally, these ground connections would [...]

Preventing AC leakage current in electronic device measurement

When performing electrical characterization measurements with AC signals, appreciable leakage current can occur as the result of two separate phenomena:

  1. AC leakage current via parasitic cable [...]

Why low noise matters for I-V measurement of electronic devices

Instrumentation performance is paramount to ensuring accurate characterization of electronic materials and devices; however, electrical measurement equipment performance varies widely. One often [...]

Model CPX for superconducting microwave device research

A new paper slated for publication in the IEEE Journal of the Electron Devices Society references the utility of a Lake Shore cryogenic probe station when performing superconducting microwave [...]

Lake Shore exhibiting at three conferences next week

Next week will be a busy one for us, with three events on our travel schedule:

The IEEE MTT International Microwave Symposium (IMS), in San Francisco (Booth 2348), where Vaden West, Western U.S. [...]

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