About the patented technology of the M81-SSM system

We often describe our M81-SSM synchronous source measure system as being unique, and what helps make it unique are three technology patents we have obtained for it. Here’s how the technologies covered by the patents benefit material and device characterization applications:

U.S. Patent 20240019517-A1

This patent relates the M81-SSM’s MeasureSync™ technology and system’s overall sampling/updating architecture, which enables you to:

  • Generate and lock-in up to three common or independent frequencies using a single instrument — in effect, replacing three or more individual lock-ins and respective voltage or current sources
  • Ensure tight and repeatable timing of single- and multi-channel measurements due to the M81-SSM’s data converter per channel (non-multiplexed) architecture

LakeShore_M81-SSM_MeasureSync_Architecture

U.S. Patent 11982730-B2

This patent pertains to M81-SSM’s voltage measure (VM-10) module and what we describe as the system’s seamless measure ranging feature. The main application benefits of this feature include:

  • Faster range changes, especially during swept voltage measurements, such as when generating I-V characteristic curves of semiconductor devices
  • Reduced amplitude discontinuities during swept voltage measurements between ranges
  • Significantly reduced acquisition time when measuring I-V curves involving many data points and range changes

U.S. Patent 11959991-B2

Our “hybrid digital and analog signal generation systems and methods” patent pertains to the system’s voltage source (VS-10) module, specifically as it relates to what we describe as the system’s dual DAC (i.e., dual DC/AC) range sourcing capability. This technology particularly benefits:

  • Applications that require the mixing of DC and AC source voltages (such as differential conductance); having independent DC and AC D/A converters and ranging amplifiers ensures full resolution and accuracy of both DC and AC signals — regardless of the ratio of DC to AC amplitudes
  • Device measurements that require both DC voltage bias and small-signal AC characterization stimulus; this is because a single VS-10 module operates equivalently to two separate single-function DC and AC voltage sources

What led us to developing these patented technologies

Lake Shore has a long history of developing precision instrumentation for purpose-built measurements, whether it’s the patented circuitry of our Model 372 AC resistance bridge for ultra-low temperature measurements or the patented measurement technology of our M91 FastHall™ controller for faster, highly precise Hall measurements. We have a wealth of experience in low-temperature control and precision electrical signal measurement. Leveraging these world-class circuit designs and our expertise in cryogenic low-level measurements enabled us to develop the M81-SSM, a system-level, modular measurement solution that provides ultra-low noise DC and AC source and measure performance.

For more information about the M81-SSM system and its advanced measurement capabilities, visit lakeshore.com/M81. And if you’d like to discuss how it can be used in your application, please let us know.

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Tags: electronic device & semiconductor measurement, material characterization, M81 synchronous source measure system

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