When using a cryogenic probe station, wafer mounting methodologies are a key element of wafer-level characterization. The mounting materials and approach will influence device temperature, sample [...]
If you’re interested in using a vibrating sample magnetometer to measure the vector components of magnetization and torque curves for magnetically anisotropic materials, then be sure to read our [...]
Capacitance-voltage (C-V) measurements are widely used by device and material researchers to characterize fundamental properties of new devices—typically under ambient conditions. A new app note [...]
The Model 372 AC resistance bridge and temperature controller makes it easy to perform multiple tasks that were once very difficult to perform reliably at very low temperatures. Yet the instrument [...]
In large-scale high-energy physics applications, cryogenic monitoring electronics have traditionally been placed close to the temperature sensors, mainly because of the very small signals used to [...]