A new book slated to be published in late May and co-edited by our own Brad Dodrill is now available for order from Springer Nature.
"Magnetic Measurement Techniques for Materials Characterization" [...]
A new book slated to be published in late May and co-edited by our own Brad Dodrill is now available for order from Springer Nature.
"Magnetic Measurement Techniques for Materials Characterization" [...]
A paper just published in the Proceedings of the National Academy of Sciences of the United States describing the study of magnetofossils as environmental change biomarkers references the use of a [...]
You may already be aware of the 8600 Series VSM’s ability to execute first-order-reversal-curve (FORC) measurements quickly and easily, enabling one to generate FORCs in a fraction of the time it [...]
As part of the scientific community’s efforts to come up with better, less expensive, and easier-to-manufacture photovoltaic technology, much of the focus has been on developing perovskites as an [...]
In April, we partnered with the Material Research Society (MRS) to host a webinar discussing a new, much faster approach to Hall measurement and analysis of low-mobility materials. Now taking this [...]
We are pleased to announce the acquisition of Janis Research’s Laboratory Cryogenics business — a move that unites two of the world’s leading providers of cryogenic and material characterization [...]
Hall effect measurements are a fundamental tool for semiconductor material characterization. However, the challenge with some Hall voltage measurements is that they can be at low voltage levels, and [...]
A key benefit of our MeasureReady™ M91 FastHall™ measurement controller is that it can be used with any type of magnet, including a superconducting magnet. One such magnet system is the Physical [...]
Liquid helium is the lifeline of tens of thousands of scientists and engineers across the global discovery and innovation landscape, including universities, industries, and national laboratories. [...]
When using a cryogenic probe station, wafer mounting methodologies are a key element of wafer-level characterization. The mounting materials and approach will influence device temperature, sample [...]