AC field Hall for measuring small Hall voltages in nanoscale devices

We have blogged about the benefits of the AC field Hall measurement method to characterize low-mobility materials. But even when mobilities aren’t very low, the AC method offers an advantage over [...]

High-temperature, wafer-level capacitance measurement app note available

In this new app note, we explore the use of a Lake Shore CRX-4K cryogenic probe station equipped with our parametric probes and a high-temperature stage for making wafer-level capacitance-voltage [...]

Model CPX for superconducting microwave device research

A new paper slated for publication in the IEEE Journal of the Electron Devices Society references the utility of a Lake Shore cryogenic probe station when performing superconducting microwave [...]

New video presentation on using cryogenic probe stations for device R&D

To learn more about temperature-dependent characterization for device research, particularly as it relates to the use of our cryogenic probe stations with the Keysight Technologies B1500A [...]

Advancing research of more efficient light emitting diode technology

With the U.S. Department of Energy’s recent announcement about new funding for solid state lighting (SSL) R&D, we thought this would be a good time to summarize how Lake Shore systems and [...]

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