High-temperature, wafer-level capacitance measurement app note available

In this new app note, we explore the use of a Lake Shore CRX-4K cryogenic probe station equipped with our parametric probes and a high-temperature stage for making wafer-level capacitance-voltage [...]

App note on use of new parametric probes for accurate C-V measurements

Capacitance-voltage (C-V) measurements are widely used by device and material researchers to characterize fundamental properties of new devices—typically under ambient conditions. A new app note [...]

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