Kevin Carmichael

Recent Posts

Optimizing circuit setup in electronic device testing

DC Circuit Types

Many people forget that when you add instrumentation to your device under test (DUT), it becomes part of the circuit. Choosing the wrong circuit setup can cause unintended [...]

Preventing magnetic interference in electronic device measurement

The trouble with shielding

Electric fields and magnetic fields have similarities, but they also have distinct differences. Studies show that many students completing an electrical engineering program [...]

Avoiding ground loops in electronic device measurements

In a closed circuit, a return path must be provided for current to flow back to the power source; this return is often referred to as an electrical ground. Ideally, these ground connections would [...]

Preventing AC leakage current in electronic device measurement

When performing electrical characterization measurements with AC signals, appreciable leakage current can occur as the result of two separate phenomena:

  1. AC leakage current via parasitic cable [...]

Why low noise matters for I-V measurement of electronic devices

Instrumentation performance is paramount to ensuring accurate characterization of electronic materials and devices; however, electrical measurement equipment performance varies widely. One often [...]

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