Andy Phillips

Recent Posts

See us in Germany and the U.K. next week

Be sure to stop by and say hello if you’re attending:

8600 Series VSM FORC measurements in support of nanocrystal research

A paper published recently in the journal Particle & Particle Systems (subscription required) details the use of magnetic characterization supporting research involving the colloidal synthesis of [...]

New F71/F41 teslameters: watch the quick-look video

This video highlights the technological firsts and measurement capabilities of our new F71 multi-axis and F41 single-axis teslameters (now available to order).

Hysteresis loop analysis software available for rock magnetism VSM research

In Earth sciences, the measurement most commonly used to characterize the magnetic properties of rock specimens for paleomagnetic and paleointensity research is that of a hysteresis loop, M(H), [...]

How the MeasureReady™ 155’s in-phase AC reference benefits small AC signal measurements

Since introducing our MeasureReady™ 155 precision current and voltage source, we continue hear feedback about how it benefits certain types of measurements. One of these is small AC signal [...]

High-temperature, wafer-level capacitance measurement app note available

In this new app note, we explore the use of a Lake Shore CRX-4K cryogenic probe station equipped with our parametric probes and a high-temperature stage for making wafer-level capacitance-voltage [...]

8600 Series plot book available for download

If you are interested in seeing typical measurement results for our award-winning 8600 Series VSM, download our new plot book. It includes results for:

Hall mobility measurements for p-type TCO research explored in new paper

Transparent conductive oxides (TCOs) are used in various optoelectronic technologies with the most widely commercialized TCOs consisting of n-type semiconductor materials. Their counterpart, the [...]

App note on use of new parametric probes for accurate C-V measurements

Capacitance-voltage (C-V) measurements are widely used by device and material researchers to characterize fundamental properties of new devices—typically under ambient conditions. A new app note [...]

Q&A with MeasureReady™ 155 Developers, Part 3: Design 'Firsts' & Low-Noise Excitation Capabilities

This three-part Q&A features insights from three employees who played key roles in the design of the new MeasureReady™ 155 I/V source as well as the new XIP (pronounced “zip”) platform, Lake [...]

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