AC field Hall for measuring small Hall voltages in nanoscale devices

We have blogged about the benefits of the AC field Hall measurement method to characterize low-mobility materials. But even when mobilities aren’t very low, the AC method offers an advantage over [...]

Data buffering feature for F71/F41 teslameters

We have enabled a buffered data streaming feature on our new teslameters to eliminate latency issues when recording field measurements on a connected PC.

See us in Germany and the U.K. next week

Be sure to stop by and say hello if you’re attending:

New video: How a DC current and voltage source works

Part of the Lake Shore Academy video education series, a new video demonstrates the theoretical operation of a DC current and voltage source as well as some notable implications during practical [...]

8600 Series VSM FORC measurements in support of nanocrystal research

A paper published recently in the journal Particle & Particle Systems (subscription required) details the use of magnetic characterization supporting research involving the colloidal synthesis of [...]

New F71/F41 teslameters: watch the quick-look video

This video highlights the technological firsts and measurement capabilities of our new F71 multi-axis and F41 single-axis teslameters (now available to order).

Hysteresis loop analysis software available for rock magnetism VSM research

In Earth sciences, the measurement most commonly used to characterize the magnetic properties of rock specimens for paleomagnetic and paleointensity research is that of a hysteresis loop, M(H), [...]

How the MeasureReady™ 155’s in-phase AC reference benefits small AC signal measurements

Since introducing our MeasureReady™ 155 precision current and voltage source, we continue hear feedback about how it benefits certain types of measurements. One of these is small AC signal [...]

High-temperature, wafer-level capacitance measurement app note available

In this new app note, we explore the use of a Lake Shore CRX-4K cryogenic probe station equipped with our parametric probes and a high-temperature stage for making wafer-level capacitance-voltage [...]

8600 Series plot book available for download

If you are interested in seeing typical measurement results for our award-winning 8600 Series VSM, download our new plot book. It includes results for:

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